Semiconductor Strain Gage for Micro-Strain Measurement

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Download Semiconductor Gage for Micro-Strain Measurement Literature

The KSP gages are stable-performance semiconductor strain gages usable for general stress measurement and transducers. The F2 type has a half-bridge formed with two (2) elements, positive and negative, for self-temperature compensation and is suitable for strain measurement of steel products.

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Semiconductor strain gage
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Semiconductor strain gage
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Semiconductor strain gage
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