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Semiconductor Strain Gage for Micro-Strain Measurement; Two (2) Element, Temperature Compensation Type

Download Semiconductor Gage for Micro-Strain Measurement, Two (2) Element, Temperature Compensation Type Literature

The KSP gages are stable-performance semiconductor strain gages usable for general stress measurement and transducers. The F2 type has a half-bridge formed with two (2) elements, positive and negative, for self-temperature compensation and is suitable for strain measurement of steel products.

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KSP-3-120-F2-11

Semiconductor strain gage
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